Unequal Path Interferometer Alignment And Use

Robert J. Zielinski

doi:10.1117/12.938215

15 December 1978 Unequal Path Interferometer Alignment And Use

Robert J. Zielinski

Proceedings Volume 0153, Advances in Optical Metrology I; (1978) https://doi.org/10.1117/12.938215
Event: 22nd Annual Technical Symposium, 1978, San Diego, United States

Abstract

A step-by-step process for aligning an unequal path interferometer is given. The interferometer as an optical test tool is discussed as are configurations for evaluating a variety of optical components and systems.

Citation Download Citation

Robert J. Zielinski "Unequal Path Interferometer Alignment And Use", Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); https://doi.org/10.1117/12.938215

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