Optical techniques for microwave monolithic circuit characterization

Hing-Loi A. Hung; Ming-Guang Li; Chi Hsiang Lee

doi:10.1117/12.46258

1 August 1991 Optical techniques for microwave monolithic circuit characterization

Hing-Loi A. Hung, Ming-Guang Li, Chi Hsiang Lee

Proceedings Volume 1476, Optical Technology for Microwave Applications V; (1991) https://doi.org/10.1117/12.46258
Event: Orlando '91, 1991, Orlando, FL, United States

Abstract

Based on the electro-optic (EO) sampling approach, a technique has been developed which offers high detection sensitivity for the measurement of two-dimensional electric field distribution in a GaAs microstrip line circuit. The interference effect in the EO sampling process was also investigated using this technique. The study resulted in a better understanding of the limitations of EO sampling. It is shown that correct use of the pulse width of the laser beam with respect to GaAs substrate thickness can lead to an accurate and consistent optical characterization of monolithic microwave integrated circuits (MMICs).

Citation Download Citation

Hing-Loi A. Hung, Ming-Guang Li, and Chi Hsiang Lee "Optical techniques for microwave monolithic circuit characterization", Proc. SPIE 1476, Optical Technology for Microwave Applications V, (1 August 1991); https://doi.org/10.1117/12.46258

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