Paper
1 March 1991 Answer to the dynamic (fretting effect) and static (oxide) behavior of electric contact surfaces: based on a five-year infrared thermographic study
Cristobal D. Paez-Leon, Antonio R. Patino, Luis Aguillon
Author Affiliations +
Abstract
This paper describes the results of a five-year study carried out in 38 power substations (230, 115, 34.5 and 13.8 Kv), located in the Western power electric system of CADAFE (Venezuela's national Electric Utility). A total of 154 hot spots were found between 1980 and 1982, a time span considered a reliable source of information in connection with methodology, term and results. The distribution of hot spots found during those years was 77, 33 and 44. The reduction of the spot/substation parameter was found to be 4.1, 3.3 and 3.1, respectively. Every item detected could have been the cause of major interruptions, locally and regionally, or even the system's blackout. The methodology used to determine the major concentration of findings and their location on the equipment, followed the sequence of Pareto's Diagram and Ishikawa's Graphic. Based on the results of the study whose results are presented here, a lubricant and compound-aid connector for Al-Al and bimetallic electric connections was formulated, developed, manufactured, tested (at IREQ laboratories) and traded (CONECTECH CAC- 01). To date, the whole process represents 12 years of work. The connector's behavior and reliability are being tested throughout Venezuela's national electric system (responsible for the supply of around 50,000 Gwh/year) with the use of 12 Tons of CONECTECH CAC-01.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cristobal D. Paez-Leon, Antonio R. Patino, and Luis Aguillon "Answer to the dynamic (fretting effect) and static (oxide) behavior of electric contact surfaces: based on a five-year infrared thermographic study", Proc. SPIE 1467, Thermosense XIII, (1 March 1991); https://doi.org/10.1117/12.46462
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KEYWORDS
Visualization

Connectors

Resistance

Oxides

Inspection

Reliability

Infrared radiation

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