AXAF precision metrology mount

Lawrence J. Cernoch; George Cheney; Carolyn H. Vasisko; Peter H. Vo

doi:10.1117/12.22823

1 November 1990 AXAF precision metrology mount

Lawrence J. Cernoch, George Cheney, Carolyn H. Vasisko, Peter H. Vo

Proceedings Volume 1333, Advanced Optical Manufacturing and Testing; (1990) https://doi.org/10.1117/12.22823
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The precision metrology mount is the structural "backbone" that supports all AXAF metrology at Hughes Danbury Optical Systems. This mount is currently designed to support P1 and Hi optics, the two outermost elements of the High Resolution Mirror Assembly (HRMA)1 . The mount must offload the mirror deterministically in a one-g field with tolerances established on the gram level. The intent of this paper is to quantify the requirements placed on the metrology mount and then to describe the design philosophy used to meet these demanding performance requirements. Finally and most importantly, the paper describes how each of the metrology mount's specifications were addressed and met from a design vantage point.

Citation Download Citation

Lawrence J. Cernoch, George Cheney, Carolyn H. Vasisko, and Peter H. Vo "AXAF precision metrology mount", Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); https://doi.org/10.1117/12.22823

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