Study of oxidization process in real time using speckle correlation

Mikiya Muramatsu; G. H. Guedes; Kiyofumi Matsuda; Thomas H. Barnes

doi:10.1117/12.51129

1 January 1991 Study of oxidization process in real time using speckle correlation

Mikiya Muramatsu, G. H. Guedes, Kiyofumi Matsuda, Thomas H. Barnes

Proceedings Volume 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection; (1991) https://doi.org/10.1117/12.51129
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Speckle correlation, in real time, is used to detect the growth of the oxfdation layer in copper at room temperature.

Citation Download Citation

Mikiya Muramatsu, G. H. Guedes, Kiyofumi Matsuda, and Thomas H. Barnes "Study of oxidization process in real time using speckle correlation", Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); https://doi.org/10.1117/12.51129

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