Optical metrology for wide field-of-view remote sensing systems

Daewook Kim

doi:10.1117/12.3049847

10 January 2025 Optical metrology for wide field-of-view remote sensing systems

Daewook Kim

Author Affiliations +

Proceedings Volume 13267, Earth Observing Missions and Sensors: Development, Implementation, and Characterization VI; 132670G (2025) https://doi.org/10.1117/12.3049847
Event: Asia-Pacific Remote Sensing, 2024, Kaohsiung, Taiwan

Abstract

For high-throughput remote sensing systems, wide field-of-view optical designs utilizing freeform or non-traditional optical surfaces are increasingly being introduced and developed. Manufacturing these enabling optical components and integrating them effectively requires optical metrology solutions to guide fabrication and assembly processes. Interferometry measures the optical path difference between test and reference beams by analyzing phase-shifted interferograms. This technique requires a null configuration setup, often employing null lenses or computer-generated holograms (CGHs), and is suitable for various surfaces, including flat, spherical, aspheric, and freeform mirrors. Deflectometry, on the other hand, measures surface slope distributions by analyzing light reflections off the optical surface using a series of camera images. This method captures the irradiance distribution to determine local surface slopes, which are then integrated to reconstruct the surface height map. It offers high precision and a broad dynamic range, making it suitable for a wide range of optical surface types. Together, these techniques provide advanced capabilities for the development and deployment of wide field-of-view remote sensing systems, paving the way for future space innovations.

(2025) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Daewook Kim "Optical metrology for wide field-of-view remote sensing systems", Proc. SPIE 13267, Earth Observing Missions and Sensors: Development, Implementation, and Characterization VI, 132670G (10 January 2025); https://doi.org/10.1117/12.3049847

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KEYWORDS

Optical surfaces

Remote sensing

Sensing systems

Optical metrology

Mirror surfaces

Optical path differences

Optical testing

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