Study of stresses in optical thin films by optical fiber technology

Shouyao Sun; Jiu Lin Zhou; Xuequan Zan

doi:10.1117/12.22430

1 December 1990 Study of stresses in optical thin films by optical fiber technology

Shouyao Sun, Jiu Lin Zhou, Xuequan Zan

Proceedings Volume 1324, Modeling of Optical Thin Films II; (1990) https://doi.org/10.1117/12.22430
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

In-situ measuring the intensity and characteristics stresses in optical coatings during deposition can get a lot of important information for improving the properties of optical thin films, which is more important for some devices uesd in modern science and technology. This paper gives a new method which uses a kind of most in-fashion sensing technology, a single-mode optical fiber sensing system developed in the middle of 1900s to test the stresses in optical coatings during deposition with the aid of a single-chip micro-computer and a micro-printer. The experimental results show that this method takes advantages of high sensitivity wide dynamic range, small volume, available in-situ measurement and easily interfaced to any vacuum system.

Citation Download Citation

Shouyao Sun, Jiu Lin Zhou, and Xuequan Zan "Study of stresses in optical thin films by optical fiber technology", Proc. SPIE 1324, Modeling of Optical Thin Films II, (1 December 1990); https://doi.org/10.1117/12.22430

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