Paper
16 August 2024 Three-wavelength demodulation method for extrinsic Fabry-Perot interferometric signal with high-finesse
Mengquan Zhu, Xiaoxiao Chang, Yuchen Xiao, Ling Sun, Huiyi Tang, Xianming Liu, Xiaohua Lei, Peng Zhang
Author Affiliations +
Proceedings Volume 13231, 4th International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2024); 1323130 (2024) https://doi.org/10.1117/12.3040305
Event: 4th International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2024), 2024, Chongqing, China
Abstract
The three-wavelength demodulation method plays a significant role in high-speed fiber Fabry-Perot sensing signal processing. It has been applied to demodulate extrinsic Fabry-Perot interferometric interference signals with low-fineness. However, there will be significant errors when it applied to high-finesse Fabry-Perot signals formed by high reflectivity. To address this issue, this paper proposes a three-wavelength arctangent phase demodulation method specifically for high-finesse Fabry-Perot interference signals. By transforming the multi-beam interference signal, the method satisfies the cosine model, enabling high-precision demodulation of optical path variation. Further experiments were conducted on thin-film Fabry-Perot signals at different temperatures, and the results demonstrate that the proposed improved three-wavelength demodulation method achieves a measurement error of less than 6 nm
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Mengquan Zhu, Xiaoxiao Chang, Yuchen Xiao, Ling Sun, Huiyi Tang, Xianming Liu, Xiaohua Lei, and Peng Zhang "Three-wavelength demodulation method for extrinsic Fabry-Perot interferometric signal with high-finesse", Proc. SPIE 13231, 4th International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2024), 1323130 (16 August 2024); https://doi.org/10.1117/12.3040305
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KEYWORDS
Demodulation

Fabry Perot interferometers

Reflectivity

Sensors

Fabry–Perot interferometry

Temperature metrology

Refractive index

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