Paper
1 October 1990 UK National Initiative on Nanotechnology: opportunities for collaborative research within the LINK Nanotechnology Programme
Peter Kennell, David W. Robinson
Author Affiliations +
Proceedings Volume 1320, Infrared Technology and Applications; (1990) https://doi.org/10.1117/12.22342
Event: Eighth International Conference Infrared Technology and Applications, 1990, London, United Kingdom
Abstract
The drive for miniaturisation and higher precision across a widening range of manufacturing activities has placed increasing demands on industry for new capabilities for machining, positioning and control and measurement to nanometre tolerances; it has also called for improved understanding of materials and processes at the molecular level. The term Nanotechnology has been adopted to encompass technological activities across this broad spectrum and is defined as the technology of manufacture where dimensions or tolerances in the range 0.1 to 100 nanometres play a critical role. The UK's National Initiative on Nanotechnology (NION) was launched in 1986 to increase awareness of this emerging technology and to promote R&D in the field and to encourage its industrial exploitation. The initiative is supported by the LINK Nanotechnology Programme (LNP) which has an initial £7.5 million of government funding to support pre-competitive collaborative research in Nanotechnology. The paper will review the activities of NION, highlighting the policies, the key technologies and application areas, and will report the progress of the LNP.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Kennell and David W. Robinson "UK National Initiative on Nanotechnology: opportunities for collaborative research within the LINK Nanotechnology Programme", Proc. SPIE 1320, Infrared Technology and Applications, (1 October 1990); https://doi.org/10.1117/12.22342
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KEYWORDS
Nanotechnology

Manufacturing

Tolerancing

Infrared technology

Diffusion tensor imaging

Ceramics

Metrology

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