Paper
1 December 1990 Echelle spectrometer for single shot elemental analysis
Alexander Scheeline, Cheryl A. Bye, Duane L. Miller, Steven W. Rynders
Author Affiliations +
Proceedings Volume 1318, Optical Spectroscopic Instrumentation and Techniques for the 1990s: Applications in Astronomy, Chemistry, and Physics; (1990) https://doi.org/10.1117/12.22089
Event: Optical Spectroscopic Instrumentation and Techniques for the 1990s: Applications in Astronomy, Chemistry, and Physics, 1990, Las Cruces, NM, United States
Abstract
The paper presents a spectrometer combining echelles with imaging detectors and optimizing the echelle design to match the behavior of the detector, to be used for simultaneous high-resolution multiwavelength observations of a variety of discharges. The instrument utilizes a dual Czerny-Turner mount, with compensation of astigmatism generated in the first spectrometer by arranging the second spectrometer in a plane orthogonal to the first. Software for displaying spectra in false color, extraction of orders from echellograms, and wavelength calibration is outlined. Application of the spectrometer to the study of three plasma systems is described.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Scheeline, Cheryl A. Bye, Duane L. Miller, and Steven W. Rynders "Echelle spectrometer for single shot elemental analysis", Proc. SPIE 1318, Optical Spectroscopic Instrumentation and Techniques for the 1990s: Applications in Astronomy, Chemistry, and Physics, (1 December 1990); https://doi.org/10.1117/12.22089
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Cited by 2 scholarly publications and 1 patent.
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KEYWORDS
Spectroscopy

Monochromatic aberrations

Charge-coupled devices

Mirrors

Sensors

Stray light

Chemical analysis

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