Thickness dependence of magneto-optical effects in ultrathin multilayered Co/Pd films

Anthony C. Palumbo; Sung-Chul Shin

doi:10.1117/12.22047

1 August 1990 Thickness dependence of magneto-optical effects in ultrathin multilayered Co/Pd films

Anthony C. Palumbo, Sung-Chul Shin

Proceedings Volume 1316, Optical Data Storage; (1990) https://doi.org/10.1117/12.22047
Event: Optical Data Storage, 1990, Vancouver, Canada

Abstract

Multilayered Co/Pd thin films were fabricated. The sublayer thicknesses of Co and Pd were varied from 2-to-8.1 angstroms and from 4.5-to-22.1 angstroms, respectively. The total film thickness was varied between 36 and 1318 angstroms. The room temperature polar Kerr rotation and ellipticity hysteresis loops were measured at a wavelength of 790 nm. It was found that the magneto-optical properties were strongly dependent on the thickness of Co and Pd sublayers as well as the total film thickness. For a 2 angstrom C/9 angstrom Pd bilayer, the index of refraction for right and left circularly polarized light was measured for an optically thick film and used to model the Kerr rotation and ellipticity as a function of film thickness. The model agreed favorably with experimental values.

Citation Download Citation

Anthony C. Palumbo and Sung-Chul Shin "Thickness dependence of magneto-optical effects in ultrathin multilayered Co/Pd films", Proc. SPIE 1316, Optical Data Storage, (1 August 1990); https://doi.org/10.1117/12.22047

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