Paper
1 August 1990 Accelerated aging studies for phase-change-type disc media
Takeo Ohta, Shige-aki Furukawa, Kazumi Yoshioka, Masami Uchida, Kazuo Inoue, Tetsuya Akiyama, Kenichi Nagata, Suguru Nakamura
Author Affiliations +
Proceedings Volume 1316, Optical Data Storage; (1990) https://doi.org/10.1117/12.22048
Event: Optical Data Storage, 1990, Vancouver, Canada
Abstract
The excellent stability of GeTe-Sb2Te3-Sb phase change disc media was demonstrated in accelerated aging studies. The disc was composed of the pseudo ternary alloy active layer of GeTe-Sb2Te3-Sb, ZnS-SiO2 dielectric layers and Al quadrilayer rapid cooling structure. This structure leads high performance C/N ratio of 55dB and more than 30dB eras ability with wide plateau power dependency. We measured the archival and the shelf characteristics of C/N and bit error rate (BER) as a function of exposure time for discs exposed to 80 degrees C 80% RH, and 90 degrees C 80% RH. From the Arrhenius plot, the life time of the phase change type disc media were expected to be longer than 60 years in 32 degrees C 80% RH environment.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takeo Ohta, Shige-aki Furukawa, Kazumi Yoshioka, Masami Uchida, Kazuo Inoue, Tetsuya Akiyama, Kenichi Nagata, and Suguru Nakamura "Accelerated aging studies for phase-change-type disc media", Proc. SPIE 1316, Optical Data Storage, (1 August 1990); https://doi.org/10.1117/12.22048
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Cited by 6 scholarly publications.
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KEYWORDS
Information operations

Dielectrics

Error analysis

Optical storage

Crystals

Aluminum

Environmental sensing

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