The Fried parameter estimating method using limited refractive structure index measurement and its influence factors over horizontal propagation path in the near-surface boundary layer

Hanjiu Zhang; Gang Sun; Xuebin Li; Shengcheng Cui; Liming Zhu; Ying Liu; Tao Luo; Ningquan Weng

doi:10.1117/12.3017482

30 April 2024 The Fried parameter estimating method using limited refractive structure index measurement and its influence factors over horizontal propagation path in the near-surface boundary layer

Hanjiu Zhang, Gang Sun, Xuebin Li, Shengcheng Cui, Liming Zhu, Ying Liu, Tao Luo, Ningquan Weng

Author Affiliations +

Proceedings Volume 13157, Sixth Conference on Frontiers in Optical Imaging and Technology: Applications of Imaging Technologies; 131570P (2024) https://doi.org/10.1117/12.3017482
Event: Sixth Conference on Frontiers in Optical Imaging Technology and Applications (FOI2023), 2023, Nanjing, JS, China

Abstract

We verify a simple alternative method to estimate the Fried parameter over a horizontal propagation path using the refractive index measured by a pair of micro-thermometers. The results show a relatively reliable estimate, especially when the optical turbulence in the path is relatively strong. Moreover, we also discuss the relationship between the Fried parameter value with the overall intensity of optical turbulence and the length of the propagation path theoretically. The influence of these two factors shows a prominent exponential characteristic, which also can be speculated from the formula.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Hanjiu Zhang, Gang Sun, Xuebin Li, Shengcheng Cui, Liming Zhu, Ying Liu, Tao Luo, and Ningquan Weng "The Fried parameter estimating method using limited refractive structure index measurement and its influence factors over horizontal propagation path in the near-surface boundary layer", Proc. SPIE 13157, Sixth Conference on Frontiers in Optical Imaging and Technology: Applications of Imaging Technologies, 131570P (30 April 2024); https://doi.org/10.1117/12.3017482

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