Calibration challenges and solutions in high-NA microscopy for short-wave infrared

Tyler V. Howard; Thomas G. Brown

doi:10.1117/12.3044381

2 October 2024 Calibration challenges and solutions in high-NA microscopy for short-wave infrared

Tyler V. Howard, Thomas G. Brown

Proceedings Volume 13129, Optical Modeling and Performance Predictions XIV; 1312909 (2024) https://doi.org/10.1117/12.3044381
Event: Optical Engineering + Applications, 2024, San Diego, California, United States

Abstract

For microscopy, high numerical apertures are necessary to resolve key features of a sample. For polarization microscopy, a high NA can result in significant polarization variation over the pupil. These systems are often challenging to calibrate for quarter-wave plates that have a strong angular dependence. This talk will describe a full system calibration method for a short-wave infrared microscope utilizing a rotating quarter-wave plate for polarization characterization of scattered light. We draw a particular distinction between calibration for direct imaging when compared to pupil imaging of dipole like objects.

Conference Presentation

Citation Download Citation

Tyler V. Howard and Thomas G. Brown "Calibration challenges and solutions in high-NA microscopy for short-wave infrared", Proc. SPIE 13129, Optical Modeling and Performance Predictions XIV, 1312909 (2 October 2024); https://doi.org/10.1117/12.3044381

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