Detection of polymer residues on the glass surface of recycled EoL photovoltaic modules using near-infrared hyper-spectral imaging

Martin De Biasio; Thomas Arnold; Gabriele C. Eder; Lukas Neumaier

doi:10.1117/12.3030795

7 June 2024 Detection of polymer residues on the glass surface of recycled EoL photovoltaic modules using near-infrared hyper-spectral imaging

Martin De Biasio, Thomas Arnold, Gabriele C. Eder, Lukas Neumaier

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Proceedings Volume 13026, Next-Generation Spectroscopic Technologies XVI; 130260L (2024) https://doi.org/10.1117/12.3030795
Event: SPIE Defense + Commercial Sensing, 2024, National Harbor, Maryland, United States

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Abstract

This study investigates the application of hyper-spectral imaging (HSI) for detecting polymer contaminants on glass substrates following photovoltaic (PV) recycling processes. HSI’s non-destructive and real-time capabilities are essential for ensuring the quality of separated PV components such as the glass pane. Experimental results demonstrate the precision of HSI in identifying polymer residues, leading to clean, uncontaminated glass suitable for complete re-use. Moreover, our work examines the challenges and future potential of HSI in contaminant detection, highlighting its importance as an in-line quality control tool in industrial recycling facilities.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

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Martin De Biasio, Thomas Arnold, Gabriele C. Eder, and Lukas Neumaier "Detection of polymer residues on the glass surface of recycled EoL photovoltaic modules using near-infrared hyper-spectral imaging", Proc. SPIE 13026, Next-Generation Spectroscopic Technologies XVI, 130260L (7 June 2024); https://doi.org/10.1117/12.3030795

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