Towards polarization sensitive tomographic diffraction microscopy: quantitative 3D differential interference contrast microscopy

Nicolas Verrier; Matthieu Debailleul; Olivier Haeberlé

doi:10.1117/12.3014705

18 June 2024 Towards polarization sensitive tomographic diffraction microscopy: quantitative 3D differential interference contrast microscopy

Nicolas Verrier, Matthieu Debailleul, Olivier Haeberlé

Author Affiliations +

Proceedings Volume 12996, Unconventional Optical Imaging IV; 129960B (2024) https://doi.org/10.1117/12.3014705
Event: SPIE Photonics Europe, 2024, Strasbourg, France

Abstract

Tomographic diffraction microscopy is a 3D marker-less imaging technique allowing for quantitative characterization of the complex refractive index of the investigated sample. The method is a generalization of digital holography with a full control of the sample’s illumination angle. Combining several holographic acquisitions through a 3D synthetic aperture process makes it possible to assess the optical field scattered by a 3D object. Recently we proposed to take benefits of the democratization of polarization array sensors to characterize birefringent samples. With this presentation, we demonstrate that using the same experimental configuration, with a modified demosaicking procedure, we can produce 3D Differential Interference Contrast microscope images of isotrope sample.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Nicolas Verrier, Matthieu Debailleul, and Olivier Haeberlé "Towards polarization sensitive tomographic diffraction microscopy: quantitative 3D differential interference contrast microscopy", Proc. SPIE 12996, Unconventional Optical Imaging IV, 129960B (18 June 2024); https://doi.org/10.1117/12.3014705

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