Presentation + Paper
18 June 2024 PISTIL interferometry: metrology device for regular segmented wavefront measurement
Author Affiliations +
Abstract
PISTIL interferometry (PISton and TILt interferometry), dedicated to the measurement of regular segmented wave surfaces such as segmented mirrors or the near-field output of coherent combined lasers, consists on making replicas of the central part of the wavefronts of each surface segment interfere with its nearest neighbors. The resulting interference pattern is made of an apposition of surfaces containing two-wave interference whose phase, frequency and orientation provide direct information on the respective heights and tilts of the segments in relation to each other. This technique has evolved into a new device called Full Light PISTIL. More compact and more efficient, this new version overcomes the drawbacks of previous PISTIL interferometer version by taking into account the whole surface of the incident wavefront. The performance obtained, estimated on a segmented mirror, is state of the art, and points the way towards a plug and play product adapted to the specific measurement needs of these surfaces, even in low light conditions.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
C. Bellanger, T. Rousseaux, B. Rouzé, and J. Primot "PISTIL interferometry: metrology device for regular segmented wavefront measurement", Proc. SPIE 12996, Unconventional Optical Imaging IV, 1299609 (18 June 2024); https://doi.org/10.1117/12.3017030
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Wavefronts

Mirror surfaces

Laser interferometry

Diffraction gratings

Interferograms

Interferometry

Metrology

Back to Top