Paper
29 December 2023 Discriminative recovery for extending depth-of-field of digital fringe projection
Author Affiliations +
Proceedings Volume 12976, Eighth Asia Pacific Conference on Optics Manufacture and Third International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2023); 129760Z (2023) https://doi.org/10.1117/12.3009040
Event: 8th Asia Pacific Conference on Optics Manufacture & 3rd International Forum of Young Scientists on Advanced Optical Manufacturing, 2023, Shenzhen, China
Abstract
Digital fringe projection (DFP) measurement technology has been widely used in research and industry due to its characteristics of fast measurement speed and easy implementation. However, when measuring objects with large surface undulations, the depth of field limitations of the camera and projector will cause part of the object to be measured to be in a state of defocus, which will reduce the measurement accuracy. This paper presents a novel method to discriminate the portion of an image that is defocused due to depth-of-field limitations and to eliminate the error caused by defocus in the phase diagram. The proposed approach first discriminates the defocused pixels in the image based on the modulation information, and then recovers the defocused regions by the information fusion method. The information fusion fixes the erroneous phase information by fusing the valid phase of the neighboring focused region with the phase of the defocused region obtained through kernel density estimation by means of the Kalman filter algorithm. Simulation and experimental results show that this method can effectively eliminate the errors caused by the depth-of-field limitation in the phase map, and can feasibly extend the depth of field of the digital fringe projection system without projecting additional images.
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Huixin Song and Lingbao Kong "Discriminative recovery for extending depth-of-field of digital fringe projection", Proc. SPIE 12976, Eighth Asia Pacific Conference on Optics Manufacture and Third International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2023), 129760Z (29 December 2023); https://doi.org/10.1117/12.3009040
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KEYWORDS
Depth of field

Phase shift keying

Modulation

Phase shifts

Phase unwrapping

Fringe analysis

Projection systems

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