Paper
28 July 2023 Combining unsupervised and supervised deep learning approaches for surface anomaly detection
Domen Rački, Dejan Tomaževič, Danijel Skočaj
Author Affiliations +
Proceedings Volume 12749, Sixteenth International Conference on Quality Control by Artificial Vision; 1274906 (2023) https://doi.org/10.1117/12.2688559
Event: Sixteenth International Conference on Quality Control by Artificial Vision, 2023, Albi, France
Abstract
Anomaly detection in an unsupervised manner has become the go-to approach in applications where data labeling proves problematic. However, these approaches aren’t completely unsupervised, since they rely on the weak knowledge of the dataset distribution into anomalous and anomaly-free subsets and typically require post-training threshold calibration in order to perform anomaly detection. Yet, they do not take advantage of available positive samples during training. In contrast, fully supervised approaches have proven to be more accurate and more efficient, however, they require a sufficient number of anomalous images to be labeled on a per-pixel level, which represents a labour-intensive task. In this paper, we propose a new hybrid approach that utilizes the best of both worlds. We use an unsupervised approach to build a model for generating pseudo labels, followed by a supervised approach in order to robustify anomaly detection. Moreover, we extend this approach with an active learning schema, that results in learning with mixed supervision. We achieve several improvements, i.e., the utilization of available positive image samples, improved anomaly detection performance, and the retention of real-time performance. The proposed approach yields results that are comparable to the fully supervised approach, and at the very least, reduces the number of required labeled anomalous samples.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Domen Rački, Dejan Tomaževič, and Danijel Skočaj "Combining unsupervised and supervised deep learning approaches for surface anomaly detection", Proc. SPIE 12749, Sixteenth International Conference on Quality Control by Artificial Vision, 1274906 (28 July 2023); https://doi.org/10.1117/12.2688559
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KEYWORDS
Image segmentation

Statistical modeling

Performance modeling

Inspection

Data modeling

Deep learning

Defect detection

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