Decentralization of synchrotron x-ray fluorescence microscopy: Recent advances in lab-based μXRF

Bill Williams

doi:10.1117/12.2676078

5 October 2023 Decentralization of synchrotron x-ray fluorescence microscopy: recent advances in lab-based μXRF

Bill Williams

Proceedings Volume 12698, X-Ray Nanoimaging: Instruments and Methods VI; 126980A (2023) https://doi.org/10.1117/12.2676078
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

Synchrotrons accelerate and bend electron beams to create tangential, high-flux photons across a wide energy range. While synchrotrons are quite challenging to access with very expensive beamtime, there are several powerful analytical modalities accessible through this approach, including X-ray crystallography, infrared microscopy, powder diffraction, X-ray absorption spectroscopy, and others. Here we discuss X-ray fluorescence microscopy (XFM), another powerful application associated with Synchrotrons, and how recent advances in lab-based μXRF (micro X-ray fluorescence) spectroscopy can be used to inform proper synchrotron design of experiment and substitute for difficult to access synchrotron beamtime. Lab-based μXRF instruments now allow decentralized access to high spatial resolution elemental mapping of samples down to 5 μm spot excitation diameter. Data will be presented comparing synchrotron-generated elemental maps to lab-based μXRF for several different sample types, including cofactor migration tracking within biological tissue sections, element accumulation and distribution in plants, and mineralogy mapping.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Bill Williams "Decentralization of synchrotron x-ray fluorescence microscopy: recent advances in lab-based μXRF", Proc. SPIE 12698, X-Ray Nanoimaging: Instruments and Methods VI, 126980A (5 October 2023); https://doi.org/10.1117/12.2676078

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