Fringe projection profilometry without explicit projector calibration

Rigoberto Juarez-Salazar; Sofia Esquivel-Hernandez; Juan Zheng; Victor H. Diaz-Ramirez; Andres G. Marrugo

doi:10.1117/12.2677133

4 October 2023 Fringe projection profilometry without explicit projector calibration

Rigoberto Juarez-Salazar, Sofia Esquivel-Hernandez, Juan Zheng, Victor H. Diaz-Ramirez, Andres G. Marrugo

Proceedings Volume 12673, Optics and Photonics for Information Processing XVII; 1267309 (2023) https://doi.org/10.1117/12.2677133
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

Metric three-dimensional reconstruction by fringe projection profilometry requires calibrating the employed camera and projector. However, the calibration process is more difficult for projectors than for cameras. This work presents a reconstruction method where the projector parameters are not required explicitly. For this, we assume the projector follows the pinhole model and single-axis fringe projection is employed. The theoretical principles are explained, and the proposed method is validated experimentally by a metric three-dimensional reconstruction. The results provide a theoretical framework for further generalization, including implicit camera calibration and lens distortion, while keeping the metric reconstruction capability.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Rigoberto Juarez-Salazar, Sofia Esquivel-Hernandez, Juan Zheng, Victor H. Diaz-Ramirez, and Andres G. Marrugo "Fringe projection profilometry without explicit projector calibration", Proc. SPIE 12673, Optics and Photonics for Information Processing XVII, 1267309 (4 October 2023); https://doi.org/10.1117/12.2677133

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