Full-field Fourier fringe analysis for industrial inspection

Andrew A. Malcolm; David R. Burton; Michael J. Lalor

doi:10.1117/12.20245

1 August 1990 Full-field Fourier fringe analysis for industrial inspection

Andrew A. Malcolm, David R. Burton, Michael J. Lalor

Proceedings Volume 1265, Industrial Inspection II; (1990) https://doi.org/10.1117/12.20245
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands

Abstract

Surface parameterisation using phase measurement of interferometric fringe patterns is supported by a strong theoretical basis. However, little work has been published with regard to the practical implementation of the available methods as tools for industrial inspection. This paper attempts to justify the choice of Fourier Fringe Analysis for this purpose and addresses some aspects of its implementation.

Citation Download Citation

Andrew A. Malcolm, David R. Burton, and Michael J. Lalor "Full-field Fourier fringe analysis for industrial inspection", Proc. SPIE 1265, Industrial Inspection II, (1 August 1990); https://doi.org/10.1117/12.20245

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