Paper
4 April 2023 Research on irradiance calibration in UV curing light source
Fangsheng Lin, Tiecheng Li, Muyao Ji
Author Affiliations +
Proceedings Volume 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications; 126175T (2023) https://doi.org/10.1117/12.2666621
Event: 9th Symposium on Novel Photoelectronic Detection Technology and Applications (NDTA 2022), 2022, Hefei, China
Abstract
Radiation curing is a chemical process that rapidly converts a low molecular weight substance into a high molecular weight product in a system that contains little solvent. For many products, radiation curing is very important, which is the most widely used method to cure products in a short time. The paper introduces two kinds of UV curing light source including UV LED and mercury lamp which are most widely used as light sources in curing. By the comparison, the main difference of UV LED and mercury lamp is different light source spectrums that introduces errors in calibration. We choose are two methods to detect the irradiance: radiometer method and spectroradiometer method. By analyzing the advantages and disadvantages of different measurement methods, we suggest adopting the radiometer method in daily calibration. Another important parameter is the uniformity of UV light distributed at the specified location. And with the increase of temperature, the output power decreases, and the life of the luminescent components will be shortened. This paper provides practical experience and technical guidance for daily calibration.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fangsheng Lin, Tiecheng Li, and Muyao Ji "Research on irradiance calibration in UV curing light source", Proc. SPIE 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications, 126175T (4 April 2023); https://doi.org/10.1117/12.2666621
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KEYWORDS
Ultraviolet radiation

Mercury

Lamps

Calibration

Ultraviolet light emitting diodes

Error analysis

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