Paper
4 April 2023 Analysis of the factors causing the defects of the ion barrier MCP view
Author Affiliations +
Proceedings Volume 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications; 126174P (2023) https://doi.org/10.1117/12.2666382
Event: 9th Symposium on Novel Photoelectronic Detection Technology and Applications (NDTA 2022), 2022, Hefei, China
Abstract
Different causes of similar view defects of ion barrier MCP were studied. Select ion barrier MCP with dark spots and bright spots. By analyzing its view and its own quality during operation, the different causes of the similar view defects of the ion barrier MCP were obtained. The analysis leads to solutions for different defects, which have a very positive effect on the improvement of the view of image intensifier.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ziheng Hao, Cong Shan, Pengbo Li, Kaili Yang, Yufeng Zhu, Chao Sun, Ni Zhang, Yang Li, Wangpeng Yin, Yuting Gao, and Jianghao Wang "Analysis of the factors causing the defects of the ion barrier MCP view", Proc. SPIE 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications, 126174P (4 April 2023); https://doi.org/10.1117/12.2666382
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KEYWORDS
Ions

Microchannel plates

Image intensifiers

Displays

Inspection

Visualization

Electric fields

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