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4 April 2023 Design of a compact 400-1700 nm imaging spectrometer with aberration correction grating
Yujie Xing, Hongmei Li, Kaiyi Ji, Xinbin Cheng, Xiong Dun
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Proceedings Volume 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications; 126174M (2023) https://doi.org/10.1117/12.2666369
Event: 9th Symposium on Novel Photoelectronic Detection Technology and Applications (NDTA 2022), 2022, Hefei, China
Abstract
Imaging spectrometer with a broad spectrum (such as 400-1700nm) plays an important role in searching for crime scene evidence. The requirement for quickly finding evidence at the crime scene pushes the imaging spectrometer to be more compact. With the development of freeform technology, the Schwarzschild imaging spectrometer with freeform surfaces has good optical performance and compact size. In this paper, aberration correction grating was used in the freeform Schwarzschild imaging spectrometer, which brought more freedom to correct the system aberrations and made the imaging spectrometer more compact. Based on this concept, the compact imaging spectrometer with aberration correction grating is an F/3.2, long slit (12.8mm) with 640 pixels design, covering the spectral range 400-1700nm with 2.6nm sampling. The design results indicate that good optical performance and manufacturability of the system are obtained. Compared with traditional freeform imaging spectrometer, whose optical system volume is 95mmX135mmX52mm, this design volume is only 85mmX125mmX48mm, almost 23% smaller than freeform type, which is very portable for on-site crime scene evidence inspection.
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Yujie Xing, Hongmei Li, Kaiyi Ji, Xinbin Cheng, and Xiong Dun "Design of a compact 400-1700 nm imaging spectrometer with aberration correction grating", Proc. SPIE 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications, 126174M (4 April 2023); https://doi.org/10.1117/12.2666369
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KEYWORDS
Spectroscopy
Imaging systems
Design and modelling
Aberration correction
Freeform optics
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