SwissFEL KB-optics at-wavelength wavefront characterisation

J. Krempaský; J. Vonka; B. Pedrini; A. Steppke; U. Flechsig; R. Follath; B. Rösner; U. H. Wagner; C. David; M. Makita; P. Vagović

doi:10.1117/12.2665587

16 June 2023 SwissFEL KB-optics at-wavelength wavefront characterisation

J. Krempaský, J. Vonka, B. Pedrini, A. Steppke, U. Flechsig, R. Follath, B. Rösner, U. H. Wagner, C. David, M. Makita, P. Vagović

Author Affiliations +

Proceedings Volume 12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI; 125810A (2023) https://doi.org/10.1117/12.2665587
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic

Abstract

Steering x-ray beams from the source towards the experiment without distorting their wavefront defines extraordinary high-quality requirements on the production of the x-ray optics. We report on how this demand settled with in situ shot-to-shot wavefront sensing optimization of KB optics at SwissFEL beamlines. This contribution presents methodology that combines moir´e interferometry and single-phase-grating Talbot interferometry. We discuss an online Kirkpatrick-Baez (KB) test plan at the Cristallina beamline based on single phase grating Talbot interferometry, demonstrating progressive optimization steps in minimizing KB wavefront distortion.

Conference Presentation

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J. Krempaský, J. Vonka, B. Pedrini, A. Steppke, U. Flechsig, R. Follath, B. Rösner, U. H. Wagner, C. David, M. Makita, and P. Vagović "SwissFEL KB-optics at-wavelength wavefront characterisation", Proc. SPIE 12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, 125810A (16 June 2023); https://doi.org/10.1117/12.2665587

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