Presentation + Paper
30 April 2023 Chemical trimming overcoat: an advanced spin-on process for photoresist enhancement in EUV lithography
Xisen Hou, Yinjie Cen, Paul Baranowsky, Doris Kang, Cong Liu, Chengbai Xu
Author Affiliations +
Abstract
The semiconductor industry is on the rise of maturing EUV lithography in high volume manufacturing (HVM). There remain, however, challenges to be overcome in the advancement of photoresist to improve yield and reduce cost of ownership. Herein, we report a novel chemical trimming overcoat process as a post-lithography spin-on solution to enhance EUV photoresist performance, enabling effective photospeed reduction as well as process window enhancement, such as reducing bridging defect at underdose. This is a highly versatile and tunable process for most chemically amplified photoresists, therefore allowing it to become a general process for a wide range of applications across EUV lithography.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xisen Hou, Yinjie Cen, Paul Baranowsky, Doris Kang, Cong Liu, and Chengbai Xu "Chemical trimming overcoat: an advanced spin-on process for photoresist enhancement in EUV lithography", Proc. SPIE 12498, Advances in Patterning Materials and Processes XL, 124980Q (30 April 2023); https://doi.org/10.1117/12.2658882
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KEYWORDS
Photoresist materials

Extreme ultraviolet lithography

Lithography

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