Front Matter: Volume 12480

doi:10.1117/12.2667617

8 December 2022 Front Matter: Volume 12480

Proceedings Volume 12480, Optical Technology and Measurement for Industrial Applications Conference 2022; 1248001 (2022) https://doi.org/10.1117/12.2667617
Event: Optics and Photonics International Congress, 2022, Yokohama, Japan

Abstract

This PDF file contains the front matter associated with SPIE Proceedings Volume 12480, including the Title Page, Copyright information, Table of Contents, Author and Conference Committee lists.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Optical Technology and Measurement for Industrial Applications Conference 2022, edited by Takeshi Hatsuzawa, Rainer Tutsch, Toru Yoshizawa, Proc. of SPIE 12480, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510660670

ISBN: 9781510660687 (electronic)

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Publication of record for individual papers is online in the SPIE Digital Library.

Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

• The first five digits correspond to the SPIE volume number.
• The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Conference Committee

Conference Chairs

Takeshi Hatsuzawa, Tokyo Institute of Technology (Japan)
Rainer Tutsch, Technische Universität Braunschweig (Germany)
Toru Yoshizawa, Tokyo University of Agriculture and Technology (Japan)

Conference Program Committee

Yukitoshi Otani, Chair, Utsunomiya University (Japan)
Masato Aketagawa, Nagaoka University of Technology (Japan)
Yasuhiko Arai, Kansai University (Japan)
Prathan Buranasiri, King Mongkut’s Institute of Technology Ladkrabang (Thailand)
Jürgen W. Czarske, TU Dresden (Germany)
Motoharu Fujigaki, University of Fukui (Japan)
Amalia Martínez-García, Centro de Investigaciones en Óptica, A.C. (Mexico)
Satoshi Gonda, National Institute of Advanced Industrial Science and Technology (Japan)
Sen Han, University of Shanghai for Science and Technology (China)
Feng-Lei Hong, Yokohama National University (Japan)
Nathan Hagen, Utsunomiya University (Japan)
Hideki Ina, Canon Inc. (Japan)
Ichiro Ishimaru, Kagawa University (Japan)
Lianhua Jin, University of Yamanashi (Japan)
Qian Kemao, Nanyang Technological University (Singapore)
Daesuk Kim, Chonbuk National University (Korea, Republic of)
Jonathan D. Kofman, University of Waterloo (Canada)
Kazuhide Kamiya, Toyama Prefectural University (Japan)
Fumio Koyama, Tokyo Institute of Technology (Japan)
Ryoichi Kuwano, Hiroshima Institute of Technology (Japan)
Yu-Lung Lo, National Cheng Kung University (Taiwan)
Yasuhiro Mizutani, Osaka University (Japan)
Pavel Pavlicek, Palacký University Olomouc (Czech Republic)
Takamasa Suzuki, Niigata University (Japan)
Satoru Takahashi, The University of Tokyo (Japan)
Toshiyuki Takatsuji, National Institute of Advanced Industrial Science and Technology (Japan)
Toshitaka Wakayama, Saitama Medical University (Japan)
Wei-Chung Wang, National Tsing Hua University (Taiwan)
Gao Wei, Tohoku University (Japan)
Jiangtao Xi, University of Wollongong (Australia)
Song Zhang, Purdue University (United States)

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"Front Matter: Volume 12480", Proc. SPIE 12480, Optical Technology and Measurement for Industrial Applications Conference 2022, 1248001 (8 December 2022); https://doi.org/10.1117/12.2667617

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