Presentation + Paper
16 March 2023 High quality optical Indium Tin Oxide (ITO) layers deposited by ion beam sputtering (IBS)
Author Affiliations +
Proceedings Volume 12422, Oxide-based Materials and Devices XIV; 124220K (2023) https://doi.org/10.1117/12.2648888
Event: SPIE OPTO, 2023, San Francisco, California, United States
Abstract
This is a study of the potential of IBS for the production of high-quality ITO layers for optical applications with additional electrical requirements. The electrical properties of ITO layers combined with underlying optical interference layers and their optical properties and surface roughness are presented.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Konstantina Kostourou, Volker Scheuer, and Daniel Kopf "High quality optical Indium Tin Oxide (ITO) layers deposited by ion beam sputtering (IBS)", Proc. SPIE 12422, Oxide-based Materials and Devices XIV, 124220K (16 March 2023); https://doi.org/10.1117/12.2648888
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KEYWORDS
Resistance

Ions

Sputter deposition

Vacuum chambers

Ion beams

Deposition processes

Tin

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