Paper
1 July 1990 1-megapixel IL-CCD image sensor with a progressive scan, antiblooming control, and lag-free operation
Eric G. Stevens, Bruce C. Burkey, D. N. Nichols, Y. Yee, David L. Losee, Tom H. Lee, Rajinder P. Khosla
Author Affiliations +
Proceedings Volume 1242, Charge-Coupled Devices and Solid State Optical Sensors; (1990) https://doi.org/10.1117/12.19430
Event: Electronic Imaging: Advanced Devices and Systems, 1990, Santa Clara, CA, United States
Abstract
A 1024 x 1024 pixel, interline charge-coupled device (IL CCD) image sensor has been developed that incorporates antiblooming and electronic exposure control while eliminating lag and obtaining a high responsivity. Of the novel features of this device are its noninterlaced, or progressive-scan architecture and dual-horizontal registers that can be used to clock out the image area by one or two lines at a time. These features make it well suited for applications demanding high-resolution-image capture from a single, high-speed scan.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric G. Stevens, Bruce C. Burkey, D. N. Nichols, Y. Yee, David L. Losee, Tom H. Lee, and Rajinder P. Khosla "1-megapixel IL-CCD image sensor with a progressive scan, antiblooming control, and lag-free operation", Proc. SPIE 1242, Charge-Coupled Devices and Solid State Optical Sensors, (1 July 1990); https://doi.org/10.1117/12.19430
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Charge-coupled devices

Photodiodes

Solid state electronics

Image sensors

Control systems

Optical sensors

Field effect transistors

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