Low absorption metrology of thin film optical components for high power continuous wave lasers

Camille Petite; Jeanne Graisset; Antonin Moreau; Hélène Krol; Catherine Grèzes-Besset; Julien Lumeau; Laurent Gallais

doi:10.1117/12.2642761

2 December 2022 Low absorption metrology of thin film optical components for high power continuous wave lasers

Camille Petite, Jeanne Graisset, Antonin Moreau, Hélène Krol, Catherine Grèzes-Besset, Julien Lumeau, Laurent Gallais

Proceedings Volume 12300, Laser-Induced Damage in Optical Materials 2022; 123000I (2022) https://doi.org/10.1117/12.2642761
Event: SPIE Laser Damage, 2022, Rochester, New York, United States

Abstract

The increase of continuous wave laser power is an important topic in various industrial and defense applications. One of the important limitation is due to optical coatings. In order to study this absorption, it is of prime importance to measure and determine the origin of this absorption. We have developed a LIT system (LIT) to perform low-absorption measurement at 1.07 μm. A multipass setup was realized and calibrated with a sensitivity of a few ppm and a ten times better accuracy is demonstrated. Then, this instrument was used to study single layers made with different materials and deposited by PIAD and multilayer components.

Conference Presentation

Citation Download Citation

Camille Petite, Jeanne Graisset, Antonin Moreau, Hélène Krol, Catherine Grèzes-Besset, Julien Lumeau, and Laurent Gallais "Low absorption metrology of thin film optical components for high power continuous wave lasers", Proc. SPIE 12300, Laser-Induced Damage in Optical Materials 2022, 123000I (2 December 2022); https://doi.org/10.1117/12.2642761

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