Poster + Paper
3 October 2022 Field-effect transistor based on ZnO:Li thin film with ferroelectric channel
A. R. Poghosyan, R. K. Hovsepyan, N. R. Aghamalyan, Y. A. Kafadaryan, H. L. Ayvazyan, H. G. Mnatsakanyan, S. I. Petrosyan
Author Affiliations +
Conference Poster
Abstract
We present an n-type channel transparent field-effect transistor (FET) using a top-gate configuration on a sapphire substrate. ZnO:Li film was used as channel, and MgF2 film - as gate insulator. Measurements showed that ZnO:Li films are ferroelectrics with spontaneous polarization Ps = 1–5 mkC/sm2 and coercive field EC = 5–10 kV/sm. The dependences of drain-source current on drain-source voltage at various gate-source voltages in two antiparallel Ps states were measured and the values of field-effect mobility and threshold voltage were determined for two Ps states: a) μ = 1.5 cm2/Vs, Uth = 30 V; b) μ = 1.7 cm2/Vs, Uth =23 V. Thus, Ps switching leads to a change in FET channel parameters. Results can be used to create a bistable or, more precisely, digital FET.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. R. Poghosyan, R. K. Hovsepyan, N. R. Aghamalyan, Y. A. Kafadaryan, H. L. Ayvazyan, H. G. Mnatsakanyan, and S. I. Petrosyan "Field-effect transistor based on ZnO:Li thin film with ferroelectric channel", Proc. SPIE 12229, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVI, 122290A (3 October 2022); https://doi.org/10.1117/12.2632104
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KEYWORDS
Transistors

Switching

Dielectric polarization

Polarization

Thin films

Field effect transistors

Zinc oxide

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