We present an n-type channel transparent field-effect transistor (FET) using a top-gate configuration on a sapphire substrate. ZnO:Li film was used as channel, and MgF2 film - as gate insulator. Measurements showed that ZnO:Li films are ferroelectrics with spontaneous polarization Ps = 1–5 mkC/sm2 and coercive field EC = 5–10 kV/sm. The dependences of drain-source current on drain-source voltage at various gate-source voltages in two antiparallel Ps states were measured and the values of field-effect mobility and threshold voltage were determined for two Ps states: a) μ = 1.5 cm2/Vs, Uth = 30 V; b) μ = 1.7 cm2/Vs, Uth =23 V. Thus, Ps switching leads to a change in FET channel parameters. Results can be used to create a bistable or, more precisely, digital FET.
|