S. Herrmann,1 P. Orel,1 T. Chattopadhyay,1 R. G. Morrishttps://orcid.org/0000-0003-2985-9962,1 G. Prigozhin,2 K. Donlon,2 R. Foster,2 M. Bautz,2 S. Allen,1,3 C. Leitz2
1Stanford Univ. (United States) 2Massachusetts Institute of Technology (United States) 3SLAC National Accelerator Lab. (United States)
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Current, state-of-the-art CCDs are close to being able to deliver all key performance figures for future strategic X-ray missions except for the required frame rates. Our Stanford group is seeking to close this technology gap through a multi-pronged approach of microelectronics, signal processing and novel detector devices, developed in collaboration with the Massachusetts Institute of Technology (MIT) and MIT Lincoln Laboratory (MIT-LL). Here we report results from our (integrated) readout electronics development, digital signal processing and novel SiSeRO (Single electron Sensitive Read Out) device characterization.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
S. Herrmann, P. Orel, T. Chattopadhyay, R. G. Morris, G. Prigozhin, K. Donlon, R. Foster, M. Bautz, S. Allen, C. Leitz, "X-ray speed reading: enabling fast, low noise readout for next-generation CCDs," Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X, 1219117 (29 August 2022); https://doi.org/10.1117/12.2630195