Presentation + Paper
29 August 2022 X-ray speed reading: enabling fast, low noise readout for next-generation CCDs
S. Herrmann, P. Orel, T. Chattopadhyay, R. G. Morris, G. Prigozhin, K. Donlon, R. Foster, M. Bautz, S. Allen, C. Leitz
Author Affiliations +
Abstract
Current, state-of-the-art CCDs are close to being able to deliver all key performance figures for future strategic X-ray missions except for the required frame rates. Our Stanford group is seeking to close this technology gap through a multi-pronged approach of microelectronics, signal processing and novel detector devices, developed in collaboration with the Massachusetts Institute of Technology (MIT) and MIT Lincoln Laboratory (MIT-LL). Here we report results from our (integrated) readout electronics development, digital signal processing and novel SiSeRO (Single electron Sensitive Read Out) device characterization.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Herrmann, P. Orel, T. Chattopadhyay, R. G. Morris, G. Prigozhin, K. Donlon, R. Foster, M. Bautz, S. Allen, and C. Leitz "X-ray speed reading: enabling fast, low noise readout for next-generation CCDs", Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X, 1219117 (29 August 2022); https://doi.org/10.1117/12.2630195
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KEYWORDS
Charge-coupled devices

Transistors

X-rays

Sensors

Capacitance

Electronics

Field effect transistors

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