Paper
27 March 2022 Numerical study on beam-based alignment of SXFEL undulator lattice
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Proceedings Volume 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications; 1216921 (2022) https://doi.org/10.1117/12.2622525
Event: Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 2021, Kunming, China
Abstract
The undulator line of the Shanghai soft X-ray Free-electron Laser facility (SXFEL) has very tight tolerances on the straightness of the electron beam trajectory. However, the beam trajectory cannot meet the lasing requirements due to the influence of beam position, launch angle and quadrupole offsets. Traditional mechanical alignment can only control the rms of offsets to about 100 μm, which is far from reaching the requirement. Further orbit correction can be achieved by beam-based alignment (BBA) method based on electron energy variations. K modulation is used to determine whether the beam passes through the quadrupole magnetic center, and the Dispersion-Free Steering (DFS) method is used to calculate the offsets of quadrupole and BPM. In this paper, a detailed result of simulation is presented which demonstrates that the beam trajectory with rms and standard deviation (σ) less than 10 μm can be obtained.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liang Xu, Nanshun Huang, Qingmin Zhang, Duan Gu, and Haixiao Deng "Numerical study on beam-based alignment of SXFEL undulator lattice", Proc. SPIE 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 1216921 (27 March 2022); https://doi.org/10.1117/12.2622525
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KEYWORDS
Beam propagation method

Magnetism

Electron beams

Optical simulations

Modulation

Free electron lasers

Indium nitride

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