Paper
20 December 2021 Polarization: singular flaw detection of the microstructure of optically transparent polycarbonate layers
Author Affiliations +
Proceedings Volume 12126, Fifteenth International Conference on Correlation Optics; 121262G (2021) https://doi.org/10.1117/12.2617051
Event: Fifteenth International Conference on Correlation Optics, 2021, Chernivtsi, Ukraine
Abstract
The article presents the results of determining the possibilities of the polarization-singular approach to improve the efficiency of Mueller-matrix polarimetry in the differential diagnosis of polycrystalline structure of optically transparent polycarbonate layers. The relationship between the characteristic values of the elements of the Mueller matrix and polarization-singular L - states of microscopic images of polycrystalline structure of optically transparent polycarbonate layers was determined. A technique for the experimental determination of the distributions of the characteristic values of Mueller-matrix images has been developed and tested. Statistical criteria for express differential diagnosis of polycrystalline structure of optically transparent polycarbonate layers with different mechanical stresses were determined.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jun Zheng, Zhebo Chen, M. Gorsky, O. Ushenko, Yu. Galushko, N. Gorodynska, P. Ryabiy, A. Arkhelyuk, Ch. Felde, O. Vanchulyak, M. Slyotov, and R. Besaha "Polarization: singular flaw detection of the microstructure of optically transparent polycarbonate layers", Proc. SPIE 12126, Fifteenth International Conference on Correlation Optics, 121262G (20 December 2021); https://doi.org/10.1117/12.2617051
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KEYWORDS
Transmittance

Polarization

Statistical analysis

Polarimetry

Mass attenuation coefficient

Multichannel imaging systems

Optical components

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