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20 December 2021 Influence of defect structure on characteristics of X- and γ-radiation detectors based on CdTe:Cl according to high-resolution X-ray diffractometry
I. Fodchuk, A. Kuzmin, O. Maslyanchuk, I. Hutsuliak, M. Solodkyi, Yu. Roman, I. Boledzyuk, P. Pynuk, M. Solovan, O. Gudymenko
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Proceedings Volume 12126, Fifteenth International Conference on Correlation Optics; 121261K (2021) https://doi.org/10.1117/12.2615854
Event: Fifteenth International Conference on Correlation Optics, 2021, Chernivtsi, Ukraine
Abstract
The defect structure of p-CdTe:Cl single crystals and MoOx/p-CdTe/MoOx heterostructures based on them were investigated by high-resolution X-ray diffractometry methods. Different models of dislocation systems were applied, according to which the densities of dislocations were estimated from the Wilson-Hall plot. It is shown that the application of the MoOx layer significantly affects the density of dislocations and their influence on the electrical and spectroscopic properties of heterostructures is estimated
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I. Fodchuk, A. Kuzmin, O. Maslyanchuk, I. Hutsuliak, M. Solodkyi, Yu. Roman, I. Boledzyuk, P. Pynuk, M. Solovan, and O. Gudymenko "Influence of defect structure on characteristics of X- and γ-radiation detectors based on CdTe:Cl according to high-resolution X-ray diffractometry", Proc. SPIE 12126, Fifteenth International Conference on Correlation Optics, 121261K (20 December 2021); https://doi.org/10.1117/12.2615854
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KEYWORDS
Heterojunctions
Crystals
Sensors
X-rays
X-ray diffraction
X-ray detectors
Spectroscopy
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