Facet optimization for edge-coupling of fiber to foundry fabricated SOI waveguides

Amir Begović; Lewis G. Carpenter; Siti Khadija Binti; M. Rakib Uddin; Amit Dikshit; Christopher Baiocco; Gerald Leake; Z. Rena Huang; Nicholas M. Fahrenkopf; David Harame

doi:10.1117/12.2610538

5 March 2022 Facet optimization for edge-coupling of fiber to foundry fabricated SOI waveguides

Amir Begović, Lewis G. Carpenter, Siti Khadija Binti, M. Rakib Uddin, Amit Dikshit, Christopher Baiocco, Gerald Leake, Z. Rena Huang, Nicholas M. Fahrenkopf, David Harame

Author Affiliations +

Proceedings Volume 12004, Integrated Optics: Devices, Materials, and Technologies XXVI; 1200410 (2022) https://doi.org/10.1117/12.2610538
Event: SPIE OPTO, 2022, San Francisco, California, United States

Conference Poster

Abstract

The reduction of optical loss for integrated photonics I/O is an important area of active research. Edge coupling (end-firing) is a key I/O technology, having advantages over grating couplers in terms of spectral bandwidth and lower insertion loss¹. Low-loss edge coupling into silicon waveguides will be critical to datacenters and telecommunications systems in order to help accommodate the aggressive growth of data analytics applications². In this work, we investigate the coupling losses from optical fiber (SMF-28) into on-chip silicon waveguides using silicon nitride edge couplers with varying chip facet angles. The expected losses were simulated using Three Dimensional Finite-Difference Time-Domain (3D-FDTD) modelling and measured experimentally to close the design-fabrication loop. The chips were produced within a state-of-the-art 300 mm CMOS foundry, using edge couplers from the foundry Process Design Kit (PDK). During optimization of the photolithography and dry etching process, the facet angle deviation from 90° was minimized. Insertion loss of the SiN edge coupler was investigated via transmission measurements utilizing both cleaved fibers and fiber V-grooves. Facet angles varied from approximately 75°–90° were tested for insertion loss and trends were consistent with the 3D-FDTD modelling. Measurements were performed over a range of 1450–1650 nm using a tunable laser source and optical power meter. In addition, facet insertion loss was isolated by using propagation loss data from an in-line testing tool that measured silicon waveguides propagation losses, on wafer and in the same wavelength band.

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Amir Begović, Lewis G. Carpenter, Siti Khadija Binti, M. Rakib Uddin, Amit Dikshit, Christopher Baiocco, Gerald Leake, Z. Rena Huang, Nicholas M. Fahrenkopf, and David Harame "Facet optimization for edge-coupling of fiber to foundry fabricated SOI waveguides", Proc. SPIE 12004, Integrated Optics: Devices, Materials, and Technologies XXVI, 1200410 (5 March 2022); https://doi.org/10.1117/12.2610538

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