Presentation + Paper
12 September 2021 Higher-order aberration analysis in symmetry-free optical systems
Author Affiliations +
Abstract
Compared to the rotationally symmetric systems, the surface-decomposed aberrations of the symmetry-free system is harder for analysis, due to the invalidity of the conventional paraxial reference. To solve this problem, a novel higher-order aberration calculation method for symmetry-free systems is proposed based on the mixed ray-tracing method, which is proved as a good approximation of the full-order transverse aberration for generalized systems. Furthermore, the method is also applicable for intrinsic/induced aberration calculation, as well as the surface additive Zernike coefficient fitting. With various potential implementations, the method is considered a convenient and powerful tool for aberration analysis of off-axis systems.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ziyao Tang and Herbert Gross "Higher-order aberration analysis in symmetry-free optical systems", Proc. SPIE 11871, Optical Design and Engineering VIII, 118710B (12 September 2021); https://doi.org/10.1117/12.2596127
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KEYWORDS
Chromatic aberrations

Matrices

Zemax

Mirrors

Aberration correction

Visualization

Zernike polynomials

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