A picometer-class displacement metrology system using photonic integrated circuit

Luke Horowitz; James Mason; Timothy Hilby; Aaron Rother; Alison Nordt

doi:10.1117/12.2594874

1 August 2021 A picometer-class displacement metrology system using photonic integrated circuit

Luke Horowitz, James Mason, Timothy Hilby, Aaron Rother, Alison Nordt

Proceedings Volume 11816, Optomechanics and Optical Alignment; 1181604 (2021) https://doi.org/10.1117/12.2594874
Event: SPIE Optical Engineering + Applications, 2021, San Diego, California, United States

Abstract

Future large space telescope missions demand extreme stability to enable high contrast coronagraphy for exoplanet observation. The wavefront control systems needed to achieve and maintain the required wavefront quality of the imaging system requires high-performance metrology sensors capable of picometer class sensitivity over long duration exposures, as well as for ground-based verification of build performance. For nearly two decades, Lockheed Martin has invested in developing laser metrology gauge technologies implemented in Photonic Integrated Circuits (PICs). We describe a high precision displacement metrology system currently under development and in test which has a path to flight for these future systems. Recent implementations have demonstrated picometer-class sensitivity at high (< 1 Hz) frequencies using largely commercial-off-the-shelf hardware. The current work aims to improve performance at longer timescales.

Conference Presentation

Citation Download Citation

Luke Horowitz, James Mason, Timothy Hilby, Aaron Rother, and Alison Nordt "A picometer-class displacement metrology system using photonic integrated circuit", Proc. SPIE 11816, Optomechanics and Optical Alignment, 1181604 (1 August 2021); https://doi.org/10.1117/12.2594874

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