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In the recording process of phase-shifting profilometry, intensity fluctuation caused by uorescent light source instability may occur and then introduce a non-ignorable phase error. More importantly, the selection of sampling speed will also affect the value of the phase error, which even up to 0.12 rad. To suppress this problem, a deep learning-based fluorescent light error suppression (DLFLES) method is proposed to achieve high-precise measurement under fluorescent light. Experiments demonstrate that the shapes of the reconstructed 3-D images are more precise using the proposed method. Our research would promote the development of accurate 3-D measurement under the interference of external light sources by using deep learning.
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Yang Zhao, Nenqing Lv, Haotian Yu, Jing Han, Lianfa Bai, Dongliang Zheng, "Fluorescent light error suppression for high-speed phase-shifting profilometry based on deep learning," Proc. SPIE 11761, Fourth International Conference on Photonics and Optical Engineering, 1176115 (15 January 2021); https://doi.org/10.1117/12.2586589