Characterization Of Laser Diode Intensity Noise At Microwave Frequencies With High Sensitivity

Mario Puleo; Piero Gambini; Emilio Vezzoni

doi:10.1117/12.963263

5 February 1990 Characterization Of Laser Diode Intensity Noise At Microwave Frequencies With High Sensitivity

Mario Puleo, Piero Gambini, Emilio Vezzoni

Proceedings Volume 1175, Coherent Lightwave Communications: Fourth in a Series; (1990) https://doi.org/10.1117/12.963263
Event: OE/FIBERS '89, 1989, Boston, United States

Abstract

A measurement technique has been developed, that allows the accurate characterization of laser diode intensity noise up to microwave frequencies, with high sensitivity. Relative intensity noise levels lower than 10^-15 Hz^-1 can be measured, with good accuracy, up to 10 GHz. Several examples are presented, showing the effects of reflections on laser noise.

Citation Download Citation

Mario Puleo, Piero Gambini, and Emilio Vezzoni "Characterization Of Laser Diode Intensity Noise At Microwave Frequencies With High Sensitivity", Proc. SPIE 1175, Coherent Lightwave Communications: Fourth in a Series, (5 February 1990); https://doi.org/10.1117/12.963263

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available