On the resolution characterization of THz and MMW FPA-based active imaging systems

François Berthiaume; Alex Paquet; Michel Doucet; Frédéric Emond; Linda Marchese

doi:10.1117/12.2587508

12 April 2021 On the resolution characterization of THz and MMW FPA-based active imaging systems

François Berthiaume, Alex Paquet, Michel Doucet, Frédéric Emond, Linda Marchese

Proceedings Volume 11745, Passive and Active Millimeter-Wave Imaging XXIV; 117450J (2021) https://doi.org/10.1117/12.2587508
Event: SPIE Defense + Commercial Sensing, 2021, Online Only

Abstract

For numerous years, INO has been developing active video rate THz imaging systems operating in the 250-750 GHz band. These systems are designed for use in application fields such as security and industrial inspection. Although such systems are already deployed in the field, standard procedures for determining key metrics of their performances such as resolution and SNR are still work in progress. To support and validate the ongoing development of our systems, proper characterization methods are needed. This article describes our development on the use of various resolution targets and measurement procedures for characterizing our FPA-based THz active imaging system prototypes operated in reflection mode (collecting energy reflected by the observed scene). We analyze and discuss the results obtained with different resolution targets such as bar charts, Siemens chart, slanted edge and point sources. The repeatability and applicability of the methods are assessed by repeating the measurement procedure and analyzing the measurement discrepancies. Our results are compared to theoretical expectations when available.

Conference Presentation

Citation Download Citation

François Berthiaume, Alex Paquet, Michel Doucet, Frédéric Emond, and Linda Marchese "On the resolution characterization of THz and MMW FPA-based active imaging systems", Proc. SPIE 11745, Passive and Active Millimeter-Wave Imaging XXIV, 117450J (12 April 2021); https://doi.org/10.1117/12.2587508

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available