Broad range pulse widths reliability model for 905 nm high power lasers

Branko Petrov; Alan Moore

doi:10.1117/12.2577741

5 March 2021 Broad range pulse widths reliability model for 905 nm high power lasers

Branko Petrov, Alan Moore

Proceedings Volume 11668, High-Power Diode Laser Technology XIX; 1166809 (2021) https://doi.org/10.1117/12.2577741
Event: SPIE LASE, 2021, Online Only

Abstract

Edge emitting laser diodes are well known and used in a vast portfolio of applications. High power pulsed edge-emitting laser diodes in the 905 nm regime have proven to be robust and reliable under operating conditions that require low repetition rates and pulse widths longer than several tens of nanoseconds. Automotive LiDAR requires other typical operating conditions: high repetition rates and short pulse widths at or below 5 ns. Therefore, a suitable reliability model that take into account these unique operating conditions is required. This work will present a universal reliability model focusing on the impact of short pulse widths on the lifetime reliability of GaAs-based high power edge emitting lasers. In order to set an empirical model, a dedicated experimental setup was conducted in-house. Pulse widths as short as 1.5 ns were used in combination with 100 kHz frequency in order to carry out accelerated tests. Proper life tests of more than 1000 hours were conducted in order to gain an insight on the impact of the pulse width on the overall reliability. Influence of the pulse width from 1.5 ns to 200 ns on the mean time to failure of typical lasers will be detailed herein. One of the main validated predictions of the new lifetime model is that use of long pulse widths allows high acceleration factors for a constant duty cycle without damaging the optical cavities for the automotive LiDAR market.

Conference Presentation

Citation Download Citation

Branko Petrov and Alan Moore "Broad range pulse widths reliability model for 905 nm high power lasers", Proc. SPIE 11668, High-Power Diode Laser Technology XIX, 1166809 (5 March 2021); https://doi.org/10.1117/12.2577741

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