Measurement of retardance variations over the apertures of liquid-crystal variable retarders

Claudio N. Ramirez; Neil C. Bruce; Juan M. Lopez-Tellez; Oscar G. Rodriguez-Herrera; Martha Rosete-Aguilar

doi:10.1117/12.2568645

20 August 2020 Measurement of retardance variations over the apertures of liquid-crystal variable retarders

Claudio N. Ramirez, Neil C. Bruce, Juan M. Lopez-Tellez, Oscar G. Rodriguez-Herrera, Martha Rosete-Aguilar

Proceedings Volume 11487, Optical Manufacturing and Testing XIII; 114871O (2020) https://doi.org/10.1117/12.2568645
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Conference Poster

Abstract

Variations of the induced retardance in the aperture of liquid-crystal variable retarders LCVR and spatial light modulators LC-SLM are measured. It is found that the induced retardance, in LCVR, shows variations over the aperture which depend on the wavelength of the light used and the voltage applied. Larger retardance variations appear near to the edges of the cell. There are also larger variations in the maximum and minimum unwrapped retardances in the retardance versus voltage curves. These voltage values and the edges positions of the cells should be avoided in applications of these devices. On the other hand, the induced retardance is calculated pixel by pixel in LC-SLM. For the same gray level over the entire LC-SLM screen, there are differences in the induced retardance between pixels located in a central area and pixels located in the edges. For correct calibration of the LC-SLM, the retardance value as a function of gray level was determined, pixel by pixel.

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Claudio N. Ramirez, Neil C. Bruce, Juan M. Lopez-Tellez, Oscar G. Rodriguez-Herrera, and Martha Rosete-Aguilar "Measurement of retardance variations over the apertures of liquid-crystal variable retarders", Proc. SPIE 11487, Optical Manufacturing and Testing XIII, 114871O (20 August 2020); https://doi.org/10.1117/12.2568645

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