Paper
27 November 1989 Investigation Of Superpolished Surfaces By X-Ray Scattering
A. V. Vinogradov, I. A. Artyukov, S. S. Borisova, N. N. Zorev, I. V. Kozhevnikov, I. F. Mikhailov, S. I. Sagitov, A. I. Fedorenko
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Abstract
We are studying the diffuse scattering occuring when the X-ray beam is reflected by real surface. This diffuse scattering is produced by microroughnesses and other irregularities of a dielectric constant which retain after any method of surface finishing. The fundamental goal of this work is the physics of diffraction at irregular surfaces and interfaces. The results can be applied to the investigation and control of superpolished surfaces which is of interest both for research snd technology.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. V. Vinogradov, I. A. Artyukov, S. S. Borisova, N. N. Zorev, I. V. Kozhevnikov, I. F. Mikhailov, S. I. Sagitov, and A. I. Fedorenko "Investigation Of Superpolished Surfaces By X-Ray Scattering", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961867
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Cited by 4 scholarly publications.
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KEYWORDS
Scattering

Correlation function

X-rays

Surface finishing

Dielectrics

Interfaces

Laser scattering

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