Versatile super-sensitive metrology using induced coherence (Conference Presentation)

William N. Plick; Nathaniel R. Miller; Sven Ramelow

doi:10.1117/12.2551454

10 March 2020 Versatile super-sensitive metrology using induced coherence (Conference Presentation)

William N. Plick, Nathaniel R. Miller, Sven Ramelow

Proceedings Volume 11295, Advanced Optical Techniques for Quantum Information, Sensing, and Metrology; 112950S (2020) https://doi.org/10.1117/12.2551454
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

We theoretically analyze the phase sensitivity of the Induced-Coherence Interferometer, including the case where the sensitivity is "boosted" into the bright input regime with coherent-light seeding. We find scaling which reaches below the shot noise limit, even when seeding the spatial mode which does not interact with the sample - or when seeding the undetected mode. Furthermore, the setup allows use of subtracted intensity measurements, instead of direct or homodyne measurements - a significant practical advantage. Bright, super-sensitive phase estimation of an object with different light fields for interaction and detection is possible.

Conference Presentation

Citation Download Citation

William N. Plick, Nathaniel R. Miller, and Sven Ramelow "Versatile super-sensitive metrology using induced coherence (Conference Presentation)", Proc. SPIE 11295, Advanced Optical Techniques for Quantum Information, Sensing, and Metrology, 112950S (10 March 2020); https://doi.org/10.1117/12.2551454

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