Presentation
10 March 2020 First-principles studies of defects, doping, and diffusion in gallium oxide (Conference Presentation)
Author Affiliations +
Proceedings Volume 11281, Oxide-based Materials and Devices XI; 1128102 (2020) https://doi.org/10.1117/12.2552231
Event: SPIE OPTO, 2020, San Francisco, California, United States
Abstract
We have used first-principles modeling, based on advanced hybrid functional calculations within density functional theory, to accurately predict properties of point defects and impurities in Ga2O3 and related materials. Point defects act as compensating centers, but they also assist diffusion of impurities. Accurate knowledge of formation energies and migration barriers then allows determining the doping profile. These results provide guidance for incorporating Ga2O3 into devices. Work performed in collaboration with J. Hwang, A. Janotti, J. L. Lyons, H. Peelaers, and J. B. Varley.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chris G. Van de Walle "First-principles studies of defects, doping, and diffusion in gallium oxide (Conference Presentation)", Proc. SPIE 11281, Oxide-based Materials and Devices XI, 1128102 (10 March 2020); https://doi.org/10.1117/12.2552231
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