Presentation
9 September 2019 Nanoscale isotopic imaging and trace analysis by extreme ultraviolet laser ablation mass spectrometry (Conference Presentation)
Author Affiliations +
Abstract
In EUV TOF MS, bright laser pulses from a compact 46.9-nm-wavelength laser [1] are focused into nanometer size spots to ablate craters a few nanometers deep on selected regions of the sample. Elemental and molecular ions in the laser-created plasma are extracted and identified by their mass-to-charge ratio (m/z) using a time-of-flight (TOF) mass spectrometer. Analysis of the spatially resolved mass spectra obtained as the sample is displaced with respect to the focused laser beam enables one to construct 3-D composition images with nanoscale resolution [2]. In this talk I will describe recent advances of extreme ultraviolet MSI that show its unique capabilities to identify low concentration of high Z elements into glass matrices, and to map isotopic ratios [3]. [1] S. Heinbuch et al, "Demonstration of a desk-top size high repetition rate soft x-ray laser," Opt. Express 13, 4050-4055 (2005). [2] I. Kuznetsov et al, "Three dimensional nanoscale molecular imaging by extreme ultraviolet laser ablation mass spectrometry, " Nature Communications, Vol. 6, Article No. 6944(2015). [3] T. Green, et al, “Characterization of extreme ultraviolet laser ablation mass spectrometry for actinide trace analysis and nanoscale isotopic imaging,” J. Analy. At. Spectrom. Vol. 32, 1092 (2017).
Conference Presentation
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Carmen S. Menoni, Lydia Rush, Ilya Kuznetsov, Andrew M. Duffin, and Jorge J. Rocca "Nanoscale isotopic imaging and trace analysis by extreme ultraviolet laser ablation mass spectrometry (Conference Presentation)", Proc. SPIE 11111, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XIII, 1111108 (9 September 2019); https://doi.org/10.1117/12.2533354
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KEYWORDS
Extreme ultraviolet

Laser ablation

Mass spectrometry

3D image processing

Ions

Molecular lasers

Molecular spectroscopy

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