Performance jump characteristics of CCD image sensor under laser irradiation

Zhen Zhang; Yubin Shi; Yunpeng Li; Pengcheng Dou; Zuodong Xu; Jianmin Zhang

doi:10.1117/12.2524253

29 March 2019 Performance jump characteristics of CCD image sensor under laser irradiation

Zhen Zhang, Yubin Shi, Yunpeng Li, Pengcheng Dou, Zuodong Xu, Jianmin Zhang

Proceedings Volume 11046, Fifth International Symposium on Laser Interaction with Matter; 110462R (2019) https://doi.org/10.1117/12.2524253
Event: Fifth International Symposium on Laser Interaction with Matter, 2018, Changsha, China

Abstract

In this paper, a series of effects of CCD interaction with laser are taken together in consideration. These effects divide the light intensity axis into three sections named respectively as ‘normal’, ‘dazzle’ and ‘damage’, along the positive direction. For the effects on first two sections, a general model is proposed to describe them, which reflect the performance jump charateristics of CCD under laser irradiation. In fact, the model contains the jump functions of three performance parameters, which are response efficiency, charge transfer inefficiency and leakage current. Thereinto, the first is used to describe the pixel itself, and the remaining two are used to describe the influence between pixels. The leakage current parameters include a variety of situations, such as the leakage current between pixels, the leakage current between channels and even the leakage current between subarrays in a large array. When all three kinds of parameters don’t jump, the CCD works normal. When anyone of them jumps, the CCD is dazzled by light. Of course, the parameter jump in a dazzled CCD can return to normal when light intensity decreases. However, the damage section on light intensity axis is temporarily not described in this paper. After all, the damaged CCD is not a CCD again.

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Zhen Zhang, Yubin Shi, Yunpeng Li, Pengcheng Dou, Zuodong Xu, and Jianmin Zhang "Performance jump characteristics of CCD image sensor under laser irradiation", Proc. SPIE 11046, Fifth International Symposium on Laser Interaction with Matter, 110462R (29 March 2019); https://doi.org/10.1117/12.2524253

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KEYWORDS

Charge-coupled devices

CCD image sensors

Laser irradiation

CCD cameras

Image sensors

Performance modeling

Laser applications

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