Presentation + Paper
4 March 2019 Photon-number-resolving transition-edge sensors for the metrology of photonic microstructures based on semiconductor quantum dots
Marco Schmidt, Martin von Helversen, Elisabeth Schlottmann, Marco López, Fabian Gericke, Jan-Hindrik Schulze, André Strittmatter, Christian Schneider, Stefan Kück, Sven Höfling, Tobias Heindel, Jörn Beyer, Stephan Reitzenstein
Author Affiliations +
Abstract
Light sources for applications in quantum information, quantum-enhanced sensing and quantum metrology are attracting increasing scientific interest. To gain inside into the underlying physical processes of quantum light generation, efficient photon detectors and experimental techniques are required to access the photon statistics. In this work, we employ photon-number-resolving (PNR) detectors based on superconducting transition-edge sensors (TESs) for the metrology of photonic microstructures with semiconductor quantum dots (QDs) as emitters. For the PNR analysis, we developed a state of the art PNR detection system based on fiber-coupled superconducting TESs. Our stand-alone system comprises six tungsten TESs, read out by six 2-stage-SQUID current sensors, and operated in a compact detector unit integrated into an adiabatic demagnetization refrigerator. This PNR detection system enables us to directly access the photon statistics of the light field emitted by our photonic microstructures. In this contribution, we focus on the PNR study of deterministically fabricated quantum light sources emitting single indistinguishable photons as well as twin-photon states. Additionally, we present a PNR-analysis of electrically pumped QD micropillar lasers exhibiting a peculiar bimodal behavior. Employing TESs our work provides direct insight into the complex emission characteristics of QD- based light sources. We anticipate, that TES-based PNR detectors, will be a viable tool for implementations of photonic quantum information processing relying on multi-photon states.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marco Schmidt, Martin von Helversen, Elisabeth Schlottmann, Marco López, Fabian Gericke, Jan-Hindrik Schulze, André Strittmatter, Christian Schneider, Stefan Kück, Sven Höfling, Tobias Heindel, Jörn Beyer, and Stephan Reitzenstein "Photon-number-resolving transition-edge sensors for the metrology of photonic microstructures based on semiconductor quantum dots", Proc. SPIE 10933, Advances in Photonics of Quantum Computing, Memory, and Communication XII, 1093305 (4 March 2019); https://doi.org/10.1117/12.2514086
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KEYWORDS
Sensors

Photodetectors

Metrology

Quantum dots

Light sources

Semiconductors

Photon polarization

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